2023年1月15日 · In this paper, we introduce a low-cost, expansible, and compatible measurement and control system for atomic force microscopes (AFM) based on a quartz tuning fork (QTF) self-sensing probe and frequency modulation, which is mainly composed of an embedded control system and a probe system.

1997年8月1日 · We report a new method of achieving tip–sample distance regulation in an atomic force microscope (AFM). A piezoelectric quartz tuning fork serves as both actuator and sensor of tip–sample interactions, allowing tip–sample distance regulation without the use of a …

2016年6月1日 · We have developed an atomic force microscope that uses an inexpensive quartz tuning fork as a micro cantilever. Because of its ease of operation and its open structure, it can be easily customized by students.

Quartz Tuning Fork Based Low Temperature Atomic Force Microscopy 6.1 Introduction The invention of scanning tunneling microscopy (STM) in 19821 and atomic force microscopy (AFM) in 19862 has enabled people to “see” atoms on solid surfaces, which is important to the understanding of surface microscopic structures and their relationship

2024年5月1日 · A quartz tuning fork-atomic force microscope (QTF-AFM) is one of the useful research instruments for studying atomic or molecular-level dynamics in an ultra-high vacuum and low-temperature environment. In such conditions, movement of atoms or molecules is minimized, eliminating concerns about thermal drift.

2024年12月1日 · Miniaturized quartz tuning forks (QTFs) have been adopted as force sensors for non-contact atomic force microscopy (AFM). However, the coupled oscillation behaviors of the QTF prongs are not well understood, preventing quantitative measurement of the nanoscale tip-sample interaction forces.

2023年4月12日 · Quartz tuning forks (QTFs) are self-sensing and possess a high quality factor, allowing them to be used as probes for atomic force microscopes (AFMs) for which they offer nano-scale resolution of sample images.

2015年8月1日 · Here, we devise a conductive Atomic Force Microscope (C-AFM) based on quartz tuning forks (QTFs) and metallic tips capable of simultaneously imaging the topography and conductance of a sample with nanoscale spatial resolution.

1997年8月1日 · We report a new method of achieving tip–sample distance regulation in an atomic force microscope (AFM). A piezoelectric quartz tuning fork serves as both actuator and sensor of...

2019年2月25日 · We introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance.