Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions ... Future advancements in FIB milling will focus on improving the resolution, throughput, and ...

Transmission Electron Microscope: FEI Talos F200s Scanning Transmission Electron Microscope (S/TEM) equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt ...

The HZDR team is utilizing its Institute of Ion Beam Physics and Materials Research ... Donor spin qubits, the focus of this project, offer greater stability against environmental perturbations ...